Studies of the Yield of Back-Scattered Electrons in Scanning Field Emission Microscopy
Open access
Datum
2019Typ
- Other Conference Item
ETH Bibliographie
yes
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Persistenter Link
https://doi.org/10.3929/ethz-b-000393843Publikationsstatus
publishedExterne Links
Verlag
ETH Zurich, Laboratory for Solid State PhysicsKonferenz
Organisationseinheit
03351 - Pescia, Danilo (emeritus) / Pescia, Danilo (emeritus)
Förderung
606988 - Sources, Interaction with Matter, Detection and Analysis of Low Energy Electrons 2 (EC)
ETH Bibliographie
yes
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