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dc.contributor.author
Cabrera, Hugo
dc.contributor.author
Bertolini, Gabriele
dc.contributor.author
Bellissimo, Alessandra
dc.contributor.author
Pescia, Danilo
dc.date.accessioned
2020-01-24T13:52:52Z
dc.date.available
2020-01-24T13:34:54Z
dc.date.available
2020-01-24T13:52:52Z
dc.date.issued
2019
dc.identifier.other
https://www.comsol.com/paper/studies-of-the-yield-of-back-scattered-electrons-in-scanning-field-emission-micr-83051
en_US
dc.identifier.uri
http://hdl.handle.net/20.500.11850/393843
dc.identifier.doi
10.3929/ethz-b-000393843
dc.format
application/pdf
en_US
dc.language.iso
en
en_US
dc.publisher
ETH Zurich, Laboratory for Solid State Physics
en_US
dc.rights.uri
http://rightsstatements.org/page/InC-NC/1.0/
dc.title
Studies of the Yield of Back-Scattered Electrons in Scanning Field Emission Microscopy
en_US
dc.type
Other Conference Item
dc.rights.license
In Copyright - Non-Commercial Use Permitted
ethz.size
24 p.
en_US
ethz.version.deposit
acceptedVersion
en_US
ethz.event
COMSOL Conference (2019)
en_US
ethz.event.location
Cambridge, United Kingdom
en_US
ethz.event.date
September 24-26, 2019
en_US
ethz.grant
Sources, Interaction with Matter, Detection and Analysis of Low Energy Electrons 2
en_US
ethz.publication.place
Zurich
en_US
ethz.publication.status
published
en_US
ethz.leitzahl
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02010 - Dep. Physik / Dep. of Physics::02505 - Laboratorium für Festkörperphysik / Laboratory for Solid State Physics::03351 - Pescia, Danilo (emeritus) / Pescia, Danilo (emeritus)
en_US
ethz.leitzahl.certified
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02010 - Dep. Physik / Dep. of Physics::02505 - Laboratorium für Festkörperphysik / Laboratory for Solid State Physics::03351 - Pescia, Danilo (emeritus) / Pescia, Danilo (emeritus)
en_US
ethz.grant.agreementno
606988
ethz.grant.fundername
EC
ethz.grant.funderDoi
10.13039/501100000780
ethz.grant.program
FP7
ethz.date.deposited
2020-01-24T13:35:01Z
ethz.source
FORM
ethz.eth
yes
en_US
ethz.availability
Open access
en_US
ethz.rosetta.installDate
2020-01-24T13:53:02Z
ethz.rosetta.lastUpdated
2022-03-29T00:50:11Z
ethz.rosetta.exportRequired
true
ethz.rosetta.versionExported
true
ethz.COinS
ctx_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.atitle=Studies%20of%20the%20Yield%20of%20Back-Scattered%20Electrons%20in%20Scanning%20Field%20Emission%20Microscopy&rft.date=2019&rft.au=Cabrera,%20Hugo&Bertolini,%20Gabriele&Bellissimo,%20Alessandra&Pescia,%20Danilo&rft.genre=unknown&rft_id=info:doi/https://www.comsol.com/paper/studies-of-the-yield-of-back-scattered-electrons-in-scanning-field-emission-micr-83051&rft.btitle=Studies%20of%20the%20Yield%20of%20Back-Scattered%20Electrons%20in%20Scanning%20Field%20Emission%20Microscopy
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