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dc.contributor.author
Valmorra, Federico
dc.contributor.author
Scalari, Giacomo
dc.contributor.author
Ohtani, Keita
dc.contributor.author
Beck, Mattias
dc.contributor.author
Faist, Jérôme
dc.date.accessioned
2024-08-06T06:43:52Z
dc.date.available
2017-06-11T14:18:38Z
dc.date.available
2024-08-06T06:43:52Z
dc.date.issued
2014
dc.identifier.uri
http://hdl.handle.net/20.500.11850/93733
dc.language.iso
en
en_US
dc.title
InGaAs/AlInGaAs THz QCL operating up to 195K in strong magnetic field
en_US
dc.type
Other Conference Item
ethz.event
32nd International Conference on the Physics of Semiconductors (ICPS 2014)
en_US
ethz.event.location
Austin, TX, USA
en_US
ethz.event.date
August 10-15, 2014
en_US
ethz.notes
Conference lecture.
en_US
ethz.publication.status
unpublished
en_US
ethz.leitzahl
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02010 - Dep. Physik / Dep. of Physics::02510 - Institut für Quantenelektronik / Institute for Quantum Electronics::03759 - Faist, Jérôme / Faist, Jérôme
en_US
ethz.leitzahl.certified
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02010 - Dep. Physik / Dep. of Physics::02510 - Institut für Quantenelektronik / Institute for Quantum Electronics::03759 - Faist, Jérôme / Faist, Jérôme
ethz.date.deposited
2017-06-11T14:18:58Z
ethz.source
ECIT
ethz.identifier.importid
imp5936529e2981b26300
ethz.ecitpid
pub:147269
ethz.eth
yes
en_US
ethz.availability
Metadata only
en_US
ethz.rosetta.installDate
2017-07-15T02:32:00Z
ethz.rosetta.lastUpdated
2023-02-06T12:44:05Z
ethz.rosetta.exportRequired
true
ethz.rosetta.versionExported
true
ethz.COinS
ctx_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.atitle=InGaAs/AlInGaAs%20THz%20QCL%20operating%20up%20to%20195K%20in%20strong%20magnetic%20field&rft.date=2014&rft.au=Valmorra,%20Federico&Scalari,%20Giacomo&Ohtani,%20Keita&Beck,%20Mattias&Faist,%20J%C3%A9r%C3%B4me&rft.genre=unknown&rft.btitle=InGaAs/AlInGaAs%20THz%20QCL%20operating%20up%20to%20195K%20in%20strong%20magnetic%20field
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