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dc.contributor.author
Kim, Yong-Jo
dc.contributor.author
Jang, Taekwang
dc.contributor.author
Cho, SeongHwan
dc.date.accessioned
2024-10-02T15:34:30Z
dc.date.available
2024-06-04T06:16:54Z
dc.date.available
2024-06-04T07:10:26Z
dc.date.available
2024-10-02T15:34:30Z
dc.date.issued
2024-10
dc.identifier.issn
0018-9200
dc.identifier.issn
1558-173X
dc.identifier.other
10.1109/JSSC.2024.3401593
en_US
dc.identifier.uri
http://hdl.handle.net/20.500.11850/676400
dc.description.abstract
We propose a digital bang-bang phase locked-loop (DBPLL) whose output rms jitter can be set to a user-defined value. By using a stochastic jitter monitoring circuit (JMC) and automatic loop bandwidth control, the proposed BBPLL can adjust its power consumption to obtain the desired target jitter during its initial set-up, regardless of conditions in process, voltage, and temperature (PVT). Implemented in 28 nm CMOS, the prototype PLL achieves rms jitter within 0.26 ps difference of the target jitter under various PVT conditions while operating at 2.88 GHz and achieving FoM of -225 dB which is state-of-the-art for ring oscillator-based BBPLLs.
en_US
dc.language.iso
en
en_US
dc.publisher
IEEE
en_US
dc.subject
Digital bang-bang phase-locked loop (DBPLL)
en_US
dc.subject
process
en_US
dc.subject
voltage and temperature (PVT) variations
en_US
dc.subject
ring oscillator
en_US
dc.subject
stochastic jitter monitoring circuit
en_US
dc.title
A Jitter Programmable Digital Bang-Bang PLL Using PVT-Invariant Stochastic Jitter Monitor
en_US
dc.type
Journal Article
dc.date.published
2024-05-22
ethz.journal.title
IEEE Journal of Solid-State Circuits
ethz.journal.volume
59
en_US
ethz.journal.issue
10
en_US
ethz.journal.abbreviated
IEEE J. Solid-State Circuits
ethz.pages.start
3253
en_US
ethz.pages.end
3262
en_US
ethz.identifier.wos
ethz.publication.status
published
en_US
ethz.leitzahl
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02140 - Dep. Inf.technologie und Elektrotechnik / Dep. of Inform.Technol. Electrical Eng.::02636 - Institut für Integrierte Systeme / Integrated Systems Laboratory::09647 - Jang, Taekwang / Jang, Taekwang
en_US
ethz.leitzahl.certified
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02140 - Dep. Inf.technologie und Elektrotechnik / Dep. of Inform.Technol. Electrical Eng.::02636 - Institut für Integrierte Systeme / Integrated Systems Laboratory::09647 - Jang, Taekwang / Jang, Taekwang
ethz.date.deposited
2024-06-04T06:17:20Z
ethz.source
WOS
ethz.eth
yes
en_US
ethz.availability
Metadata only
en_US
ethz.rosetta.installDate
2024-10-02T15:34:31Z
ethz.rosetta.lastUpdated
2024-10-02T15:34:31Z
ethz.rosetta.versionExported
true
ethz.COinS
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