Piezoresponse force microscopy at sub-room temperatures
dc.contributor.author
Lilienblum, Martin
dc.contributor.author
Hoffmann, A.
dc.contributor.author
Soergel, E.
dc.contributor.author
Becker, Petra
dc.contributor.author
Bohatý, Ladislav
dc.contributor.author
Fiebig, Manfred
dc.date.accessioned
2017-06-10T16:38:24Z
dc.date.available
2017-06-10T16:38:24Z
dc.date.issued
2013
dc.identifier.issn
0034-6748
dc.identifier.issn
1089-7623
dc.identifier.other
10.1063/1.4801464
dc.identifier.uri
http://hdl.handle.net/20.500.11850/66465
dc.language.iso
en
dc.publisher
American Institute of Physics
dc.subject
Atomic force microscopy
dc.subject
Force measurement
dc.subject
Rubidium compounds
dc.title
Piezoresponse force microscopy at sub-room temperatures
dc.type
Journal Article
ethz.journal.title
Review of Scientific Instruments
ethz.journal.volume
84
ethz.journal.issue
4
ethz.journal.abbreviated
Rev Sci Instrum
ethz.pages.start
043703
ethz.size
5 p.
ethz.notes
Received 26 February 2013, Accepted 27 March 2013, Published online 22 April 2013.
ethz.identifier.wos
ethz.identifier.nebis
000025185
ethz.publication.place
New York, NY
ethz.publication.status
published
ethz.leitzahl
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02160 - Dep. Materialwissenschaft / Dep. of Materials::03918 - Fiebig, Manfred / Fiebig, Manfred
ethz.leitzahl.certified
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02160 - Dep. Materialwissenschaft / Dep. of Materials::03918 - Fiebig, Manfred / Fiebig, Manfred
ethz.date.deposited
2017-06-10T16:41:48Z
ethz.source
ECIT
ethz.identifier.importid
imp5936509113f5b26981
ethz.ecitpid
pub:105940
ethz.eth
yes
ethz.availability
Metadata only
ethz.rosetta.installDate
2017-07-12T17:04:04Z
ethz.rosetta.lastUpdated
2024-02-01T20:24:11Z
ethz.rosetta.versionExported
true
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Journal Article [130747]