Imaging polarimetry: Opportunities and limitations

Thumbnail
Metadata only
Author
Stenflo, Jan Olof
Date
2003
Type
    Other Conference Item
Publication status
published
External links
Editor
Fineschi, S.
Journal / series
Polarimetry in astronomy
Volume
4843
Pages / Article No.
76 - 88
Publisher
SPIE
Event
Conference on Polarimetry in Astronomy, Waikoloa, HI, USA, August 25-28, 2002
Subject
Polarimetry; Astrophysics; Magnetic fields; Zeeman effect; Hanle effect; Atomic physics
More
Show all metadata
ETH Bibliography
yes
Altmetrics