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dc.contributor.author
Pierobon, Leonardo
dc.contributor.author
Schäublin, Robin
dc.contributor.author
Löffler, Jörg F.
dc.date.accessioned
2021-08-02T16:32:14Z
dc.date.available
2021-07-22T02:45:11Z
dc.date.available
2021-08-02T16:32:14Z
dc.date.issued
2021-07-12
dc.identifier.issn
0003-6951
dc.identifier.issn
1077-3118
dc.identifier.other
10.1063/5.0055270
en_US
dc.identifier.uri
http://hdl.handle.net/20.500.11850/496953
dc.identifier.doi
10.3929/ethz-b-000496953
dc.description.abstract
Magnetization structures in magnetic materials are usually imaged in dedicated Lorentz transmission electron microscopes. Compared to conventional transmission electron microscopes, the magnetic field of the objective lens at the sample is removed by replacing the objective lens with a Lorentz lens below the sample. While this modification is critical for soft-magnetic materials whose magnetic state is affected by the strong magnetic field of the objective lens, we propose that this is not necessary for permanent magnets such as Sm-Co and Nd-Fe-B. Conventional and Lorentz microscopes are compared for imaging divergent and convergent domain walls in a Sm(Co,Fe,Cu,Zr)(7.7) magnet. Both techniques provide an almost identical resolution and accuracy in the measurement of the domain-wall width parameter using focal-series imaging of divergent domain walls. It is further demonstrated that both techniques can be utilized to analyze the intensity profile of convergent domain walls. From this, the product of sample thickness and magnetic induction is extracted. These results illustrate that conventional microscopes can be used to image the magnetic state of permanent magnets with a resolution comparable to dedicated Lorentz microscopes, which make magnetic imaging experiments significantly more accessible to a wider scientific community.
en_US
dc.format
application/pdf
en_US
dc.language.iso
en
en_US
dc.publisher
American Institute of Physics
dc.rights.uri
http://creativecommons.org/licenses/by/4.0/
dc.title
Comparison of conventional and Lorentz transmission electron microscopy in magnetic imaging of permanent magnets
en_US
dc.type
Journal Article
dc.rights.license
Creative Commons Attribution 4.0 International
dc.date.published
2021-07-12
ethz.journal.title
Applied Physics Letters
ethz.journal.volume
119
en_US
ethz.journal.issue
2
en_US
ethz.journal.abbreviated
Appl. Phys. Lett.
ethz.pages.start
022401
en_US
ethz.size
6 p.
en_US
ethz.version.deposit
publishedVersion
en_US
ethz.grant
Advanced nanoscale characterization of magnetic defects in metals
en_US
ethz.identifier.wos
ethz.identifier.scopus
ethz.publication.place
Melville, NY
ethz.publication.status
published
en_US
ethz.leitzahl
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02160 - Dep. Materialwissenschaft / Dep. of Materials::02645 - Institut für Metallforschung / Institute of Metals Research::03661 - Löffler, Jörg F. / Löffler, Jörg F.
en_US
ethz.leitzahl
ETH Zürich::00002 - ETH Zürich::00003 - Schulleitung und Dienste::00022 - Bereich VP Forschung / Domain VP Research::02891 - ScopeM / ScopeM
ethz.leitzahl.certified
ETH Zürich::00002 - ETH Zürich::00003 - Schulleitung und Dienste::00022 - Bereich VP Forschung / Domain VP Research::02891 - ScopeM / ScopeM
ethz.leitzahl.certified
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02160 - Dep. Materialwissenschaft / Dep. of Materials::02645 - Institut für Metallforschung / Institute of Metals Research::03661 - Löffler, Jörg F. / Löffler, Jörg F.
en_US
ethz.grant.agreementno
172934
ethz.grant.fundername
SNF
ethz.grant.funderDoi
10.13039/501100001711
ethz.grant.program
Projekte MINT
ethz.date.deposited
2021-07-22T02:45:30Z
ethz.source
WOS
ethz.eth
yes
en_US
ethz.availability
Open access
en_US
ethz.rosetta.installDate
2021-08-02T16:32:22Z
ethz.rosetta.lastUpdated
2024-02-02T14:27:53Z
ethz.rosetta.versionExported
true
ethz.COinS
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