High-speed multiresolution scanning probe microscopy based on Lissajous scan trajectories
dc.contributor.author
Tuma, Tomas
dc.contributor.author
Lygeros, John
dc.contributor.author
Kartik, V.
dc.contributor.author
Sebastian, Abu
dc.contributor.author
Pantazi, Angeliki
dc.date.accessioned
2017-06-09T23:46:32Z
dc.date.available
2017-06-09T23:46:32Z
dc.date.issued
2012-05
dc.identifier.issn
1361-6528
dc.identifier.issn
0957-4484
dc.identifier.other
10.1088/0957-4484/23/18/185501
dc.identifier.uri
http://hdl.handle.net/20.500.11850/48865
dc.language.iso
en
dc.publisher
IOP Publishing
dc.title
High-speed multiresolution scanning probe microscopy based on Lissajous scan trajectories
dc.type
Journal Article
ethz.journal.title
Nanotechnology
ethz.journal.volume
23
ethz.journal.issue
18
ethz.pages.start
185501
ethz.notes
Received 31 January 2012.
ethz.identifier.wos
ethz.identifier.nebis
000552937
ethz.publication.place
Bristol
ethz.publication.status
published
ethz.leitzahl
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02140 - Dep. Inf.technologie und Elektrotechnik / Dep. of Inform.Technol. Electrical Eng.::02650 - Institut für Automatik / Automatic Control Laboratory::03751 - Lygeros, John / Lygeros, John
ethz.leitzahl.certified
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02140 - Dep. Inf.technologie und Elektrotechnik / Dep. of Inform.Technol. Electrical Eng.::02650 - Institut für Automatik / Automatic Control Laboratory::03751 - Lygeros, John / Lygeros, John
ethz.date.deposited
2017-06-09T23:46:37Z
ethz.source
ECIT
ethz.identifier.importid
imp59364f32054fe68898
ethz.ecitpid
pub:80386
ethz.eth
yes
ethz.availability
Metadata only
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2017-07-14T15:23:08Z
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2024-02-01T18:40:11Z
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Publikationstyp
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Journal Article [131552]