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dc.contributor.author
Mihailovic, Ian A.
dc.contributor.contactPerson
Mihailovic, Ian
dc.date.accessioned
2021-08-06T08:35:49Z
dc.date.available
2021-05-25T14:15:36Z
dc.date.available
2021-07-26T11:15:42Z
dc.date.available
2021-07-26T12:01:24Z
dc.date.available
2021-08-06T08:35:49Z
dc.date.issued
2021
dc.identifier.uri
http://hdl.handle.net/20.500.11850/486155
dc.identifier.doi
10.3929/ethz-b-000486155
dc.format
application/zip
en_US
dc.format
application/vnd.openxmlformats-officedocument.spreadsheetml.sheet
en_US
dc.format
text/plain
en_US
dc.format
text/csv
en_US
dc.language.iso
en
en_US
dc.publisher
ETH Zurich
en_US
dc.rights.uri
http://rightsstatements.org/page/InC-NC/1.0/
dc.title
Memristive behavior of electrodeposited bismuth selenide
en_US
dc.type
Data Collection
dc.rights.license
In Copyright - Non-Commercial Use Permitted
dc.date.published
2021-07-26
ethz.size
0.08 GB
en_US
ethz.publication.place
Zurich
en_US
ethz.leitzahl
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02130 - Dep. Maschinenbau und Verfahrenstechnik / Dep. of Mechanical and Process Eng.::03609 - Hierold, Christofer / Hierold, Christofer
en_US
ethz.leitzahl.certified
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02130 - Dep. Maschinenbau und Verfahrenstechnik / Dep. of Mechanical and Process Eng.::03609 - Hierold, Christofer / Hierold, Christofer
en_US
ethz.date.retentionend
indefinite
en_US
ethz.date.retentionendDate
n/a
ethz.relation.isSupplementTo
20.500.11850/499755
ethz.relation.isReferencedBy
10.3929/ethz-b-000556977
ethz.date.deposited
2021-05-25T14:15:50Z
ethz.source
FORM
ethz.eth
yes
en_US
ethz.availability
Open access
en_US
ethz.rosetta.installDate
2021-07-26T12:01:31Z
ethz.rosetta.lastUpdated
2024-02-02T14:29:49Z
ethz.rosetta.versionExported
true
ethz.COinS
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