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dc.contributor.author
Buhmann, Marco
dc.contributor.author
Liebrich, Thomas
dc.contributor.author
Roth, Raoul
dc.date.accessioned
2021-04-16T13:08:40Z
dc.date.available
2021-01-27T15:06:04Z
dc.date.available
2021-04-16T13:08:40Z
dc.date.issued
2019-11
dc.identifier.uri
http://hdl.handle.net/20.500.11850/466059
dc.description.abstract
The ability to verify the geometrical quality of a workpiece on the machine tool itself can be a crucial advantage in ultra precision diamond turning. This work presents a test procedure for single point distance measuring optical probes integrated on diamond turning machines (DTMs). To be able to specify the probe´s characteristics a strategy using the axis of the DTM itself is developed. Figure 1 shows the experimental setup consisting of a measurement target mounted on the z axis and the probe mounted on the x axis of the DTM. The flat metallic diamond turned surface used as measurement target is positioned orthogonal to the z axis. While running a NC program, which commands a specific trajectory, for example a sinusoidal path, the glass scale signal of the DTM and the probe´s distance signal is recorded with a frequency of up to one kilohertz. By analyzing the glass scale signal the actual movement of the z axis can be extracted and used as a nominal value to evaluate the quality of the probe signal and its characteristics. An estimation of deviations caused by misalignment of the probe and measurement target is described. Besides that, effects caused by a possible time delay, temperature drifts and dynamic effects of the machine axis are taken into account and strategies to contain these effects are shown. By adjusting the programmed trajectory the probe´s measuring range to be tested can be varied. Furthermore, by tilting the probe in regard to the measurement target´s surface (see Figure 1 (b)), the important behavior in non orthogonal measurements on high reflective surfaces can be investigated. In the present work an interferometric probe is employed. The obtained deviations slightly differ depending on the probe´s tilt and distance value. With a linear compensation for a measuring range of four micrometers the maximum error can be reduced by fifty percent to residual deviations of less than twenty nanometers.
en_US
dc.language.iso
en
en_US
dc.publisher
euspen
en_US
dc.subject
On-machine measurement
en_US
dc.subject
Ultra-precision
en_US
dc.subject
DIAMOND TOOLS (MACHINING)
en_US
dc.title
Testing procedure for optical probes integrated on ultra-precision diamond turning machines
en_US
dc.type
Other Conference Item
dc.date.published
2019-11-27
ethz.pages.start
MN19122
en_US
ethz.size
2 p.
en_US
ethz.code.ddc
DDC - DDC::6 - Technology, medicine and applied sciences::670 - Manufacturing
en_US
ethz.event
euspen - Special Interest Group Meeting: Micro/Nano Manufacturing
en_US
ethz.event.location
Berlin, Germany
en_US
ethz.event.date
November 28-29, 2019
en_US
ethz.notes
Conference lecture held on November 28, 2019.
en_US
ethz.publication.place
Cranfield
en_US
ethz.publication.status
published
en_US
ethz.leitzahl
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02130 - Dep. Maschinenbau und Verfahrenstechnik / Dep. of Mechanical and Process Eng.::02623 - Inst. f. Werkzeugmaschinen und Fertigung / Inst. Machine Tools and Manufacturing::03641 - Wegener, Konrad (emeritus) / Wegener, Konrad (emeritus)
en_US
ethz.leitzahl.certified
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02130 - Dep. Maschinenbau und Verfahrenstechnik / Dep. of Mechanical and Process Eng.::02623 - Inst. f. Werkzeugmaschinen und Fertigung / Inst. Machine Tools and Manufacturing::03641 - Wegener, Konrad (emeritus) / Wegener, Konrad (emeritus)
en_US
ethz.date.deposited
2021-01-27T15:06:12Z
ethz.source
FORM
ethz.eth
yes
en_US
ethz.availability
Metadata only
en_US
ethz.rosetta.installDate
2021-04-16T13:08:50Z
ethz.rosetta.lastUpdated
2024-02-02T13:31:46Z
ethz.rosetta.versionExported
true
ethz.COinS
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