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dc.contributor.author
Denkinger, Benoît W.
dc.contributor.author
Ponzina, Flavio
dc.contributor.author
Basu, Soumya S.
dc.contributor.author
Bonetti, Andrea
dc.contributor.author
Balási, Szabolcs
dc.contributor.author
Ruggiero, Martino
dc.contributor.author
Peón-Quirós, Miguel
dc.contributor.author
Rossi, Davide
dc.contributor.author
Burg, Andreas
dc.contributor.author
Atienza, David
dc.date.accessioned
2020-05-07T08:36:47Z
dc.date.available
2020-05-07T02:49:30Z
dc.date.available
2020-05-07T08:36:47Z
dc.date.issued
2020-04
dc.identifier.issn
2168-2364
dc.identifier.issn
2168-2356
dc.identifier.other
10.1109/MDAT.2019.2947282
en_US
dc.identifier.uri
http://hdl.handle.net/20.500.11850/413433
dc.language.iso
en
en_US
dc.publisher
IEEE
en_US
dc.title
Impact of memory voltage scaling on accuracy and resilience of deep learning based edge devices
en_US
dc.type
Journal Article
dc.date.published
2019-10-14
ethz.journal.title
IEEE Design & Test
ethz.journal.volume
37
en_US
ethz.journal.issue
2
en_US
ethz.pages.start
84
en_US
ethz.pages.end
92
en_US
ethz.identifier.wos
ethz.identifier.scopus
ethz.publication.place
New York, NY
en_US
ethz.publication.status
published
en_US
ethz.date.deposited
2020-05-07T02:49:41Z
ethz.source
SCOPUS
ethz.eth
yes
en_US
ethz.availability
Metadata only
en_US
ethz.rosetta.installDate
2020-05-07T08:36:59Z
ethz.rosetta.lastUpdated
2022-03-29T02:03:38Z
ethz.rosetta.versionExported
true
ethz.COinS
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