Impact of memory voltage scaling on accuracy and resilience of deep learning based edge devices
dc.contributor.author
Denkinger, Benoît W.
dc.contributor.author
Ponzina, Flavio
dc.contributor.author
Basu, Soumya S.
dc.contributor.author
Bonetti, Andrea
dc.contributor.author
Balási, Szabolcs
dc.contributor.author
Ruggiero, Martino
dc.contributor.author
Peón-Quirós, Miguel
dc.contributor.author
Rossi, Davide
dc.contributor.author
Burg, Andreas
dc.contributor.author
Atienza, David
dc.date.accessioned
2020-05-07T08:36:47Z
dc.date.available
2020-05-07T02:49:30Z
dc.date.available
2020-05-07T08:36:47Z
dc.date.issued
2020-04
dc.identifier.issn
2168-2364
dc.identifier.issn
2168-2356
dc.identifier.other
10.1109/MDAT.2019.2947282
en_US
dc.identifier.uri
http://hdl.handle.net/20.500.11850/413433
dc.language.iso
en
en_US
dc.publisher
IEEE
en_US
dc.title
Impact of memory voltage scaling on accuracy and resilience of deep learning based edge devices
en_US
dc.type
Journal Article
dc.date.published
2019-10-14
ethz.journal.title
IEEE Design & Test
ethz.journal.volume
37
en_US
ethz.journal.issue
2
en_US
ethz.pages.start
84
en_US
ethz.pages.end
92
en_US
ethz.identifier.wos
ethz.identifier.scopus
ethz.publication.place
New York, NY
en_US
ethz.publication.status
published
en_US
ethz.date.deposited
2020-05-07T02:49:41Z
ethz.source
SCOPUS
ethz.eth
yes
en_US
ethz.availability
Metadata only
en_US
ethz.rosetta.installDate
2020-05-07T08:36:59Z
ethz.rosetta.lastUpdated
2022-03-29T02:03:38Z
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true
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Journal Article [130186]