Dopants and Traps in Nanocrystal-Based Semiconductor Thin Films: Origins and Measurement of Electronic Midgap States
Open access
Date
2020-02-25Type
- Journal Article
Permanent link
https://doi.org/10.3929/ethz-b-000397313Publication status
publishedExternal links
Journal / series
ACS Applied Electronic MaterialsVolume
Pages / Article No.
Publisher
American Chemical SocietySubject
Nanocrystal thin films; PbS; trap state; electronic midgap state; Fourier transform photocurrent spectroscopy; FTPS; energy-resolved electrochemical impedance spectroscopy; ER-EISOrganisational unit
03895 - Wood, Vanessa / Wood, Vanessa
09701 - Yarema, Maksym / Yarema, Maksym
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