Dopants and Traps in Nanocrystal-Based Semiconductor Thin Films: Origins and Measurement of Electronic Midgap States
dc.contributor.author
Volk, Sebastian
dc.contributor.author
Yazdani, Nuri
dc.contributor.author
Yarema, Olesya
dc.contributor.author
Yarema, Maksym
dc.contributor.author
Wood, Vanessa
dc.date.accessioned
2021-02-08T12:52:50Z
dc.date.available
2020-02-06T10:36:35Z
dc.date.available
2020-02-06T12:04:47Z
dc.date.available
2020-05-26T06:45:07Z
dc.date.available
2021-02-08T12:52:50Z
dc.date.issued
2020-02-25
dc.identifier.issn
2637-6113
dc.identifier.other
10.1021/acsaelm.9b00685
en_US
dc.identifier.uri
http://hdl.handle.net/20.500.11850/397313
dc.identifier.doi
10.3929/ethz-b-000397313
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application/pdf
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dc.language.iso
en
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dc.publisher
American Chemical Society
dc.rights.uri
http://rightsstatements.org/page/InC-NC/1.0/
dc.subject
Nanocrystal thin films
en_US
dc.subject
PbS
en_US
dc.subject
trap state
en_US
dc.subject
electronic midgap state
en_US
dc.subject
Fourier transform photocurrent spectroscopy
en_US
dc.subject
FTPS
en_US
dc.subject
energy-resolved electrochemical impedance spectroscopy
en_US
dc.subject
ER-EIS
en_US
dc.title
Dopants and Traps in Nanocrystal-Based Semiconductor Thin Films: Origins and Measurement of Electronic Midgap States
en_US
dc.type
Journal Article
dc.rights.license
In Copyright - Non-Commercial Use Permitted
dc.date.published
2020-02-02
ethz.journal.title
ACS Applied Electronic Materials
ethz.journal.volume
2
en_US
ethz.journal.issue
2
en_US
ethz.journal.abbreviated
ACS Appl. Electron. Mater.
ethz.pages.start
398
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ethz.pages.end
404
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ethz.size
7 p.
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acceptedVersion
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ethz.identifier.wos
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ethz.publication.place
Washington, DC
ethz.publication.status
published
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ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02140 - Dep. Inf.technologie und Elektrotechnik / Dep. of Inform.Technol. Electrical Eng.::02634 - Institut für Elektronik / Institute for Electronics::03895 - Wood, Vanessa / Wood, Vanessa
en_US
ethz.leitzahl
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02140 - Dep. Inf.technologie und Elektrotechnik / Dep. of Inform.Technol. Electrical Eng.::02634 - Institut für Elektronik / Institute for Electronics::09701 - Yarema, Maksym / Yarema, Maksym
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ethz.leitzahl.certified
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02140 - Dep. Inf.technologie und Elektrotechnik / Dep. of Inform.Technol. Electrical Eng.::02634 - Institut für Elektronik / Institute for Electronics::03895 - Wood, Vanessa / Wood, Vanessa
en_US
ethz.leitzahl.certified
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02140 - Dep. Inf.technologie und Elektrotechnik / Dep. of Inform.Technol. Electrical Eng.::02634 - Institut für Elektronik / Institute for Electronics::09701 - Yarema, Maksym / Yarema, Maksym
ethz.date.deposited
2020-02-06T10:36:43Z
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FORM
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yes
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ethz.availability
Open access
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ethz.date.embargoend
2021-02-03
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2020-05-26T06:45:16Z
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2024-02-02T13:03:22Z
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