The impact of the catalyst layer structure on phosphoric acid migration in HT-PEFC – An operando X-ray tomographic microscopy study
dc.contributor.author
Halter, Jonathan
dc.contributor.author
Bevilacqua, N.
dc.contributor.author
Schmidt, Thomas
dc.contributor.author
Büchi, Felix N.
dc.date.accessioned
2020-01-20T11:23:17Z
dc.date.available
2020-01-19T22:30:40Z
dc.date.available
2020-01-20T11:23:17Z
dc.date.issued
2020-02-15
dc.identifier.issn
1873-2569
dc.identifier.issn
0022-0728
dc.identifier.issn
1572-6657
dc.identifier.other
10.1016/j.jelechem.2020.113832
en_US
dc.identifier.uri
http://hdl.handle.net/20.500.11850/391798
dc.language.iso
en
en_US
dc.publisher
Elsevier
en_US
dc.subject
High temperature polymer electrolyte fuel cell
en_US
dc.subject
Phosphoric acid
en_US
dc.subject
Catalyst layer cracks
en_US
dc.subject
X-ray tomographic microscopy
en_US
dc.subject
Mitigating electrolyte losses
en_US
dc.subject
Lifetime
en_US
dc.title
The impact of the catalyst layer structure on phosphoric acid migration in HT-PEFC – An operando X-ray tomographic microscopy study
en_US
dc.type
Journal Article
dc.date.published
2020-01-08
ethz.journal.title
Journal of Electroanalytical Chemistry
ethz.journal.volume
859
en_US
ethz.journal.abbreviated
J. electroanal. chem. interfacial electrochem.
ethz.pages.start
113832
en_US
ethz.size
7 p.
en_US
ethz.identifier.wos
ethz.identifier.scopus
ethz.publication.place
Amsterdam
en_US
ethz.publication.status
published
en_US
ethz.leitzahl
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02020 - Dep. Chemie und Angewandte Biowiss. / Dep. of Chemistry and Applied Biosc.::02543 - Inst. f. Molekulare Physikalische Wiss. / Institute of Molecular Physical Science::03910 - Schmidt, Thomas J. / Schmidt, Thomas J.
ethz.leitzahl.certified
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02020 - Dep. Chemie und Angewandte Biowiss. / Dep. of Chemistry and Applied Biosc.::02543 - Inst. f. Molekulare Physikalische Wiss. / Institute of Molecular Physical Science::03910 - Schmidt, Thomas J. / Schmidt, Thomas J.
ethz.date.deposited
2020-01-19T22:30:44Z
ethz.source
SCOPUS
ethz.eth
yes
en_US
ethz.availability
Metadata only
en_US
ethz.rosetta.installDate
2020-01-20T11:23:31Z
ethz.rosetta.lastUpdated
2024-02-02T10:10:47Z
ethz.rosetta.versionExported
true
ethz.COinS
ctx_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.atitle=The%20impact%20of%20the%20catalyst%20layer%20structure%20on%20phosphoric%20acid%20migration%20in%20HT-PEFC%20%E2%80%93%20An%20operando%20X-ray%20tomographic%20microscopy&rft.jtitle=Journal%20of%20Electroanalytical%20Chemistry&rft.date=2020-02-15&rft.volume=859&rft.spage=113832&rft.issn=1873-2569&0022-0728&1572-6657&rft.au=Halter,%20Jonathan&Bevilacqua,%20N.&Schmidt,%20Thomas&B%C3%BCchi,%20Felix%20N.&rft.genre=article&rft_id=info:doi/10.1016/j.jelechem.2020.113832&
Files in this item
| Files | Size | Format | Open in viewer |
|---|---|---|---|
|
There are no files associated with this item. |
|||
Publication type
-
Journal Article [131603]