A Multiscale TCAD Approach for the Simulation of InP DHBTs and the Extraction of Their Transit Times
dc.contributor.author
Wen, Xin
dc.contributor.author
Mukherjee, Chhandak
dc.contributor.author
Raya, Christian
dc.contributor.author
Ardouin, Bertrand
dc.contributor.author
Deng, Marina
dc.contributor.author
Frégonèse, Sébastien
dc.contributor.author
Nodjiadjim, Virginie
dc.contributor.author
Riet, Muriel
dc.contributor.author
Quan, Wei
dc.contributor.author
Arabhavi, Akshay
dc.contributor.author
Ostinelli, Olivier
dc.contributor.author
Bolognesi, Colombo R.
dc.contributor.author
Zimmer, Thomas
dc.contributor.author
Maneux, Cristell
dc.contributor.author
Luisier, Mathieu
dc.date.accessioned
2019-11-29T14:55:37Z
dc.date.available
2019-11-11T10:40:25Z
dc.date.available
2019-11-11T11:05:09Z
dc.date.available
2019-11-29T14:55:37Z
dc.date.issued
2019-12
dc.identifier.issn
0018-9383
dc.identifier.issn
1557-9646
dc.identifier.other
10.1109/ted.2019.2946514
en_US
dc.identifier.uri
http://hdl.handle.net/20.500.11850/376701
dc.language.iso
en
en_US
dc.publisher
IEEE
en_US
dc.subject
Compact model
en_US
dc.subject
Device simulation
en_US
dc.subject
Double heterojunction bipolar transistors (DHBTs)
en_US
dc.subject
GaAsSb/InPDHBTs
en_US
dc.subject
HiCuM
en_US
dc.subject
InGaAs/InP DHBTs
en_US
dc.subject
Transit time
en_US
dc.title
A Multiscale TCAD Approach for the Simulation of InP DHBTs and the Extraction of Their Transit Times
en_US
dc.type
Journal Article
dc.date.published
2019-11-01
ethz.journal.title
IEEE Transactions on Electron Devices
ethz.journal.volume
66
en_US
ethz.journal.issue
12
en_US
ethz.journal.abbreviated
IEEE Trans. Electron Devices
ethz.pages.start
5084
en_US
ethz.pages.end
5090
en_US
ethz.grant
ULTIMATE: Upper Limit Technology Investigations Mandatory to Attain Terahertz Electronics
en_US
ethz.identifier.wos
ethz.identifier.scopus
ethz.publication.place
New York, NY
ethz.publication.status
published
en_US
ethz.leitzahl
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02140 - Dep. Inf.technologie und Elektrotechnik / Dep. of Inform.Technol. Electrical Eng.::03721 - Bolognesi, Colombo / Bolognesi, Colombo
en_US
ethz.leitzahl
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02140 - Dep. Inf.technologie und Elektrotechnik / Dep. of Inform.Technol. Electrical Eng.::02636 - Institut für Integrierte Systeme / Integrated Systems Laboratory::03925 - Luisier, Mathieu / Luisier, Mathieu
ethz.leitzahl.certified
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02140 - Dep. Inf.technologie und Elektrotechnik / Dep. of Inform.Technol. Electrical Eng.::02636 - Institut für Integrierte Systeme / Integrated Systems Laboratory::03925 - Luisier, Mathieu / Luisier, Mathieu
ethz.leitzahl.certified
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02140 - Dep. Inf.technologie und Elektrotechnik / Dep. of Inform.Technol. Electrical Eng.::03721 - Bolognesi, Colombo / Bolognesi, Colombo
en_US
ethz.grant.agreementno
169413
ethz.grant.fundername
SNF
ethz.grant.funderDoi
10.13039/501100001711
ethz.grant.program
Projekte MINT
ethz.date.deposited
2019-11-11T10:40:40Z
ethz.source
FORM
ethz.eth
yes
en_US
ethz.availability
Metadata only
en_US
ethz.rosetta.installDate
2019-11-29T14:55:46Z
ethz.rosetta.lastUpdated
2024-02-02T09:55:44Z
ethz.rosetta.versionExported
true
ethz.COinS
ctx_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.atitle=A%20Multiscale%20TCAD%20Approach%20for%20the%20Simulation%20of%20InP%20DHBTs%20and%20the%20Extraction%20of%20Their%20Transit%20Times&rft.jtitle=IEEE%20Transactions%20on%20Electron%20Devices&rft.date=2019-12&rft.volume=66&rft.issue=12&rft.spage=5084&rft.epage=5090&rft.issn=0018-9383&1557-9646&rft.au=Wen,%20Xin&Mukherjee,%20Chhandak&Raya,%20Christian&Ardouin,%20Bertrand&Deng,%20Marina&rft.genre=article&rft_id=info:doi/10.1109/ted.2019.2946514&
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