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dc.contributor.author
Heidler, Jonas
dc.contributor.author
Pantelic, Radosav
dc.contributor.author
Wennmacher, Julian T.C.
dc.contributor.author
Zaubitzer, Christian
dc.contributor.author
Fecteau-Lefebvre, Ariane
dc.contributor.author
Goldie, Kenneth N.
dc.contributor.author
Müller, Elisabeth
dc.contributor.author
Holstein, Julian J.
dc.contributor.author
Van Genderen, Eric
dc.contributor.author
De Carlo, Sacha
dc.contributor.author
Gruene, Tim
dc.date.accessioned
2019-05-22T09:12:26Z
dc.date.available
2019-05-18T00:56:20Z
dc.date.available
2019-05-22T09:12:26Z
dc.date.issued
2019-05
dc.identifier.issn
2059-7983
dc.identifier.other
10.1107/S2059798319003942
en_US
dc.identifier.uri
http://hdl.handle.net/20.500.11850/342844
dc.identifier.doi
10.3929/ethz-b-000342844
dc.description.abstract
3D electron diffraction has reached a stage where the structures of chemical compounds can be solved productively. Instrumentation is lagging behind this development, and to date dedicated electron diffractometers for data collection based on the rotation method do not exist. Current studies use transmission electron microscopes as a workaround. These are optimized for imaging, which is not optimal for diffraction studies. The beam intensity is very high, it is difficult to create parallel beam illumination and the detectors used for imaging are of only limited use for diffraction studies. In this work, the combination of an EIGER hybrid pixel detector with a transmission electron microscope to construct a productive electron diffractometer is described. The construction not only refers to the combination of hardware but also to the calibration of the system, so that it provides rapid access to the experimental parameters that are necessary for processing diffraction data. Until fully integrated electron diffractometers become available, this describes a setup for productive and efficient operation in chemical crystallography.
en_US
dc.format
application/pdf
en_US
dc.language.iso
en
en_US
dc.publisher
Wiley
en_US
dc.rights.uri
http://creativecommons.org/licenses/by/4.0/
dc.subject
electron diffractometer
en_US
dc.subject
EIGER X 1M detector
en_US
dc.subject
3D electron diffraction
en_US
dc.subject
chemical crystallography
en_US
dc.subject
EIGER hybrid pixel detector
en_US
dc.subject
structural chemistry
en_US
dc.title
Design guidelines for an electron diffractometer for structural chemistry and structural biology
en_US
dc.type
Journal Article
dc.rights.license
Creative Commons Attribution 4.0 International
dc.date.published
2019-04-08
ethz.journal.title
Acta Crystallographica Section D: Structural Biology
ethz.journal.volume
75
en_US
ethz.journal.issue
5
en_US
ethz.journal.abbreviated
Acta Cryst. D
ethz.pages.start
458
en_US
ethz.pages.end
466
en_US
ethz.version.deposit
publishedVersion
en_US
ethz.identifier.wos
ethz.identifier.scopus
ethz.publication.place
Chichester
en_US
ethz.publication.status
published
en_US
ethz.leitzahl
ETH Zürich::00002 - ETH Zürich::00003 - Schulleitung und Dienste::00022 - Bereich VP Forschung / Domain VP Research::02891 - ScopeM / ScopeM
ethz.leitzahl.certified
ETH Zürich::00002 - ETH Zürich::00003 - Schulleitung und Dienste::00022 - Bereich VP Forschung / Domain VP Research::02891 - ScopeM / ScopeM
ethz.date.deposited
2019-05-18T00:56:25Z
ethz.source
SCOPUS
ethz.eth
yes
en_US
ethz.availability
Open access
en_US
ethz.rosetta.installDate
2019-05-22T09:12:37Z
ethz.rosetta.lastUpdated
2022-03-28T22:57:57Z
ethz.rosetta.versionExported
true
ethz.COinS
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