Heavy atom labeling enables silanol defect visualization in silicalite-1 crystals
Abstract
Using heavy-atom labeling in conjunction with electron microscopy, we here visualize the distribution of point defects, i.e. internal silanol groups, in silicalite-1 zeolites at the single crystal level.
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https://doi.org/10.3929/ethz-b-000313220Publication status
publishedExternal links
Journal / series
Chemical CommunicationsVolume
Pages / Article No.
Publisher
Royal Society of ChemistryOrganisational unit
03746 - Van Bokhoven, Jeroen A. / Van Bokhoven, Jeroen A.
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