An On-Chip Self-Characterization of a Digital-to-Time Converter by Embedding it in a First-OrderΔΣLoop
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Date
2018Type
- Journal Article
Publication status
publishedExternal links
Journal / series
IEEE Transactions on Circuits and Systems I: Regular PapersVolume
Pages / Article No.
Publisher
IEEESubject
Digital-to-time converter (DTC); time-to-digital converter (TDC); buit-in selft-test (BIST); first-order delta-sigma modulator; noise shaping; self calibration; PLLOrganisational unit
03380 - Huang, Qiuting (emeritus) / Huang, Qiuting (emeritus)
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