Variability Mitigation in Nanometer CMOS Integrated Systems: A Survey of Techniques From Circuits to Software
dc.contributor.author
Rahimi, Abbas
dc.contributor.author
Benini, Luca
dc.contributor.author
Gupta, Rajesh K.
dc.date.accessioned
2017-06-12T09:50:09Z
dc.date.available
2017-06-12T09:50:09Z
dc.date.issued
2016-07
dc.identifier.issn
0018-9219
dc.identifier.issn
1558-2256
dc.identifier.other
10.1109/jproc.2016.2518864
dc.identifier.uri
http://hdl.handle.net/20.500.11850/118825
dc.language.iso
en
dc.publisher
IEEE
dc.subject
Approximate computing
dc.subject
Resilient systems
dc.subject
Timing errors
dc.subject
Variability
dc.title
Variability Mitigation in Nanometer CMOS Integrated Systems: A Survey of Techniques From Circuits to Software
dc.type
Journal Article
ethz.journal.title
Proceedings of the IEEE
ethz.journal.volume
104
ethz.journal.issue
7
ethz.journal.abbreviated
Proc. I.E.E.E.
ethz.pages.start
1410
ethz.pages.end
1448
ethz.notes
Published online 7 March 2016.
ethz.identifier.wos
ethz.identifier.scopus
ethz.identifier.nebis
000033996
ethz.publication.place
New York, NY
ethz.publication.status
published
ethz.leitzahl
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02140 - Dep. Inf.technologie und Elektrotechnik / Dep. of Inform.Technol. Electrical Eng.::02636 - Institut für Integrierte Systeme / Integrated Systems Laboratory::03996 - Benini, Luca / Benini, Luca
ethz.leitzahl.certified
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02140 - Dep. Inf.technologie und Elektrotechnik / Dep. of Inform.Technol. Electrical Eng.::02636 - Institut für Integrierte Systeme / Integrated Systems Laboratory::03996 - Benini, Luca / Benini, Luca
ethz.date.deposited
2017-06-12T09:56:48Z
ethz.source
ECIT
ethz.identifier.importid
imp593654947b77011342
ethz.ecitpid
pub:180791
ethz.eth
yes
ethz.availability
Metadata only
ethz.rosetta.installDate
2017-07-15T05:28:30Z
ethz.rosetta.lastUpdated
2022-03-28T15:03:44Z
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true
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