Carrier lifetimes in uniaxially strained Ge micro bridges
dc.contributor.author
Geiger, R.
dc.contributor.author
Süess, M.J.
dc.contributor.author
Bonzon, C.
dc.contributor.author
Frigerio, J.
dc.contributor.author
Chrastina, D.
dc.contributor.author
Isella, G.
dc.contributor.author
Spolenak, Ralph
dc.contributor.author
Faist, Jérôme
dc.contributor.author
Sigg, H.
dc.date.accessioned
2017-06-11T14:18:38Z
dc.date.available
2017-06-11T14:18:38Z
dc.date.issued
2014
dc.identifier.isbn
978-1-4799-2282-6
dc.identifier.isbn
978-1-4799-2283-3
dc.identifier.other
10.1109/Group4.2014.6961937
dc.identifier.uri
http://hdl.handle.net/20.500.11850/93734
dc.language.iso
en
dc.publisher
IEEE
dc.title
Carrier lifetimes in uniaxially strained Ge micro bridges
dc.type
Conference Paper
ethz.book.title
IEEE 11th International Conference on Group IV Photonics 2014 (GFP 2014)
ethz.pages.start
227
ethz.pages.end
228
ethz.event
IEEE 11th International Conference on Group IV Photonics 2014 (GFP 2014)
ethz.event.location
Paris, France
ethz.event.date
August 27-29, 2014
ethz.identifier.wos
ethz.publication.place
Piscataway, NJ
ethz.publication.status
published
ethz.leitzahl
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02160 - Dep. Materialwissenschaft / Dep. of Materials::02645 - Institut für Metallforschung / Institute of Metals Research::03692 - Spolenak, Ralph / Spolenak, Ralph
ethz.leitzahl
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02010 - Dep. Physik / Dep. of Physics::02510 - Institut für Quantenelektronik / Institute for Quantum Electronics::03759 - Faist, Jérôme / Faist, Jérôme
ethz.leitzahl.certified
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02160 - Dep. Materialwissenschaft / Dep. of Materials::02645 - Institut für Metallforschung / Institute of Metals Research::03692 - Spolenak, Ralph / Spolenak, Ralph
ethz.leitzahl.certified
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02010 - Dep. Physik / Dep. of Physics::02510 - Institut für Quantenelektronik / Institute for Quantum Electronics::03759 - Faist, Jérôme / Faist, Jérôme
ethz.date.deposited
2017-06-11T14:18:58Z
ethz.source
ECIT
ethz.identifier.importid
imp5936529e2b40b50931
ethz.ecitpid
pub:147270
ethz.eth
yes
ethz.availability
Metadata only
ethz.rosetta.installDate
2017-07-15T02:31:32Z
ethz.rosetta.lastUpdated
2024-02-01T22:28:25Z
ethz.rosetta.versionExported
true
ethz.COinS
ctx_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.atitle=Carrier%20lifetimes%20in%20uniaxially%20strained%20Ge%20micro%20bridges&rft.date=2014&rft.spage=227&rft.epage=228&rft.au=Geiger,%20R.&S%C3%BCess,%20M.J.&Bonzon,%20C.&Frigerio,%20J.&Chrastina,%20D.&rft.isbn=978-1-4799-2282-6&978-1-4799-2283-3&rft.genre=proceeding&rft_id=info:doi/10.1109/Group4.2014.6961937&rft.btitle=IEEE%2011th%20International%20Conference%20on%20Group%20IV%20Photonics%202014%20(GFP%202014)
Files in this item
| Files | Size | Format | Open in viewer |
|---|---|---|---|
|
There are no files associated with this item. |
|||
Publication type
-
Conference Paper [35553]