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Reading distance degradation mechanisms of near-field RFID devices
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Author
Jacob, Peter
Knecht, Willy
Kunz, Albert
Nicoletti, Giovanni
Lautenschlager, Thomas
Mondada, Moreno
Pachoud, Damien
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Date
2009-09
Type
Conference Paper
ETH Bibliography
yes
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Publication status
published
External links
https://doi.org/10.1016/j.microrel.2009.06.012
Journal / series
Microelectronics Reliability
Volume
49
(9-11)
Pages / Article No.
1288
-
1292
Publisher
Elsevier
Event
20th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis
,
Arcachon, France
,
October 05-09, 2009
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