Complex ESD protection elements and issues in decananometre CMOS technologies
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Author
Date
2007Type
- Doctoral Thesis
ETH Bibliography
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https://doi.org/10.3929/ethz-a-005409438Publication status
publishedExternal links
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ETHSubject
ANLAGENSCHUTZ (ELEKTRISCHE SCHUTZVORRICHTUNGEN); KOMPLEMENTÄRE METALLOXID-HALBLEITERSCHALTUNGEN, CMOS (MIKROELEKTRONIK); STATISCHE LADUNG UND ENTLADUNG (ELEKTROSTATIK); ELECTRICAL INSTALLATIONS PROTECTION (ELECTRICAL PROTECTIVE DEVICES); LEISTUNGSELEKTRONIK; STATIC CHARGE AND DISCHARGE (ELECTROSTATICS); THYRISTOREN (ELEKTRONIK); TRANSISTORS/TEGFET, VFET, MODFET, MOSFET, MESFET, SGFET, ISFET, MISFET, HFET, JFET, CIGFET, POSFET (ELECTRONICS); THYRISTORS (ELECTRONICS); POWER ELECTRONICS; COMPLEMENTARY-METAL-OXIDE-SEMICONDUCTOR CIRCUITS, CMOS (MICROELECTRONICS); TRANSISTOREN/TEGFET, VFET, MODFET, MOSFET, MESFET, SGFET, ISFET, MISFET, HFET, JFET, CIGFET, POSFET (ELEKTRONIK)Organisational unit
03228 - Fichtner, Wolfgang
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ETH Bibliography
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