Electron Microprobe Analysis of Minor and Trace Elements in Beam Sensitive Materials: How Far Can We Go?

Metadata only

Author

Date

2019-08

Type

Conference Paper

ETH Bibliography

yes

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Publication status

published

External links

Journal / series

Microscopy and Microanalysis

Volume

25(S2)

Pages / Article No.

2312 - 2313

Publisher

Cambridge University Press

Event

Microscopy & Microanalysis (MM 2019), Portland, OR, USA, August 4-8, 2019

Organisational unit

03958 - Bachmann, Olivier / Bachmann, Olivier
03958 - Bachmann, Olivier / Bachmann, Olivier

Notes

Conference lecture held on August 7, 2019

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ETH Bibliography

yes

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Research Collection