Simulation of 3D laser scanning with phase-based EDM for the prediction of systematic deviations
Open access
Date
2019-06-21Type
- Conference Paper
ETH Bibliography
yes
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Permanent link
https://doi.org/10.3929/ethz-b-000350320Publication status
publishedExternal links
Book title
Modeling Aspects in Optical Metrology VIIVolume
Pages / Article No.
Publisher
SPIEEvent
Subject
electronic distance measurement (EDM); laser scanning; numerical simulation; ray tracing modeling; systematic deviations; Mixed pixelsOrganisational unit
03964 - Wieser, Andreas / Wieser, Andreas
Funding
169318 - Modeling surface-related uncertainty of terrestrial laser scanning (SNF)
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ETH Bibliography
yes
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