Iterative De-Embedding and Extracted Maximum Oscillation Frequency f-MAX in mm-Wave InP DHBTs: Impact of Device Dimensions on Extraction Errors
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publishedExternal links
Book title
2018 IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium (BCICTS)Pages / Article No.
Publisher
IEEEEvent
Subject
InP/GaAsSb DHBTs; sub-millimeter wave measurements; iterative de-embedding; Size dependence; frequency rangeOrganisational unit
03721 - Bolognesi, Colombo / Bolognesi, Colombo
02205 - FIRST-Lab / FIRST Center for Micro- and Nanoscience
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