Reliability Issues in Flash-Memory-Based Solid-State Drives: Experimental Analysis, Mitigation, Recovery
dc.contributor.author
Cai, Yu
dc.contributor.author
Ghose, Saugata
dc.contributor.author
Haratsch, Erich F.
dc.contributor.author
Luo, Yixin
dc.contributor.author
Mutlu, Onur
dc.contributor.editor
Micheloni, Rino
dc.contributor.editor
Marelli, Alessia
dc.contributor.editor
Eshghi, Kam
dc.date.accessioned
2019-03-04T09:25:33Z
dc.date.available
2019-01-03T15:02:02Z
dc.date.available
2019-03-04T09:25:33Z
dc.date.issued
2018
dc.identifier.isbn
978-981-13-0598-6
en_US
dc.identifier.isbn
978-981-13-0599-3
en_US
dc.identifier.other
10.1007/978-981-13-0599-3_9
en_US
dc.identifier.uri
http://hdl.handle.net/20.500.11850/313615
dc.language.iso
en
en_US
dc.publisher
Springer
en_US
dc.title
Reliability Issues in Flash-Memory-Based Solid-State Drives: Experimental Analysis, Mitigation, Recovery
en_US
dc.type
Book Chapter
dc.date.published
2018-07-12
ethz.book.title
Inside Solid State Drives (SSDs)
en_US
ethz.journal.title
Springer Series in Advanced Microelectronics
ethz.journal.volume
37
en_US
ethz.pages.start
233
en_US
ethz.pages.end
341
en_US
ethz.publication.place
Singapore
en_US
ethz.publication.status
published
en_US
ethz.leitzahl
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02140 - Dep. Inf.technologie und Elektrotechnik / Dep. of Inform.Technol. Electrical Eng.::09483 - Mutlu, Onur / Mutlu, Onur
en_US
ethz.leitzahl.certified
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02140 - Dep. Inf.technologie und Elektrotechnik / Dep. of Inform.Technol. Electrical Eng.::09483 - Mutlu, Onur / Mutlu, Onur
en_US
ethz.date.deposited
2019-01-03T15:02:09Z
ethz.source
FORM
ethz.eth
yes
en_US
ethz.availability
Metadata only
en_US
ethz.rosetta.installDate
2019-03-04T09:25:43Z
ethz.rosetta.lastUpdated
2019-03-04T09:25:43Z
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true
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Book Chapter [9505]