In Situ Defect-Screening of Integrated LDMOS for Critical Automotive Applications

Metadata only

Author

Date

2010

Type

Conference Paper

ETH Bibliography

yes

Altmetrics

Publication status

published

Book title

Proceedings of The 22nd International Symposium on Power Semiconductor Devices & ICs, Hiroshima

Pages / Article No.

285 - 288

Publisher

IEEE

Event

22nd International Symposium on Power Semiconductor Devices & IC's (ISPSD), Hiroshima, Japan, June 6-10, 2010

Organisational unit

03228 - Fichtner, Wolfgang

More

ETH Bibliography

yes

Altmetrics

Research Collection