Detecting and mitigating data-dependent DRAM failures by exploiting current memory content

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Autor(in)
Khan, Samira
Wilkerson, Chris
Wang, Zhe
Alameldeen, Alaa R.
Lee, Donghyuk
Mutlu, Onur
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Datum
2017
Typ
    Conference Paper
Publikationsstatus
published
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Buchtitel
Proceedings of the 50th Annual IEEE/ACM International Symposium on Microarchitecture (MICRO-50 '17)
Seiten / Artikelnummer
27 - 40
Verlag
Association for Computing Machinery
Konferenz
50th Annual IEEE/ACM International Symposium on Microarchitecture (MICRO-50 '17), Cambridge, MA, USA, October 14-18, 2017
Thema
DRAM; Data-Dependent Failures; System-Level Failure De- tection and Mitigation; Performance; Energy; Fault Tolerance; Refresh; Retention Failures; Memory Systems; Reliability
Organisationseinheit
09483 - Mutlu, Onur / Mutlu, Onur  
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Zitate
60 Zitate in Scopus
ETH Bibliographie
yes
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