Show simple item record

dc.contributor.author
Patel, Minesh
dc.contributor.author
Kim, Jeremie S.
dc.contributor.author
Mutlu, Onur
dc.date.accessioned
2017-10-17T15:37:53Z
dc.date.available
2017-10-06T04:37:38Z
dc.date.available
2017-10-17T15:37:53Z
dc.date.issued
2017-05
dc.identifier.isbn
978-1-4503-4892-8
en_US
dc.identifier.other
10.1145/3079856.3080242
en_US
dc.identifier.uri
http://hdl.handle.net/20.500.11850/192147
dc.language.iso
en
en_US
dc.publisher
Association for Computing Machinery
dc.subject
DRAM
en_US
dc.subject
refresh
en_US
dc.subject
retention failures
en_US
dc.subject
reliability
en_US
dc.subject
testing
en_US
dc.subject
memory
en_US
dc.title
The reach profiler (REAPER): Enabling the mitigation of DRAM retention failures via profiling at aggressive conditions
en_US
dc.type
Conference Paper
ethz.book.title
Proceedings of the 44th Annual International Symposium on Computer Architecture (ISCA '17)
en_US
ethz.journal.title
Proceedings - International Symposium on Computer Architecture
ethz.journal.volume
45
en_US
ethz.journal.issue
2
en_US
ethz.pages.start
255
en_US
ethz.pages.end
268
en_US
ethz.event
44th Annual International Symposium on Computer Architecture (ISCA '17)
en_US
ethz.event.location
Toronto, Canada
ethz.event.date
June 24-28, 2017
en_US
ethz.identifier.scopus
ethz.publication.place
New York, NY
ethz.publication.status
published
en_US
ethz.leitzahl
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02140 - Dep. Inf.technologie und Elektrotechnik / Dep. of Inform.Technol. Electrical Eng.::09483 - Mutlu, Onur / Mutlu, Onur
ethz.leitzahl.certified
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02140 - Dep. Inf.technologie und Elektrotechnik / Dep. of Inform.Technol. Electrical Eng.::09483 - Mutlu, Onur / Mutlu, Onur
ethz.relation.isReferencedBy
10.3929/ethz-b-000542542
ethz.date.deposited
2017-10-06T04:37:40Z
ethz.source
SCOPUS
ethz.eth
yes
en_US
ethz.availability
Metadata only
en_US
ethz.rosetta.installDate
2017-10-17T15:37:54Z
ethz.rosetta.lastUpdated
2024-02-02T02:39:31Z
ethz.rosetta.versionExported
true
ethz.COinS
ctx_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.atitle=The%20reach%20profiler%20(REAPER):%20Enabling%20the%20mitigation%20of%20DRAM%20retention%20failures%20via%20profiling%20at%20aggressive%20conditions&rft.jtitle=Proceedings%20-%20International%20Symposium%20on%20Computer%20Architecture&rft.date=2017-05&rft.volume=45&rft.issue=2&rft.spage=255&rft.epage=268&rft.au=Patel,%20Minesh&Kim,%20Jeremie%20S.&Mutlu,%20Onur&rft.isbn=978-1-4503-4892-8&rft.genre=proceeding&rft_id=info:doi/10.1145/3079856.3080242&rft.btitle=Proceedings%20of%20the%2044th%20Annual%20International%20Symposium%20on%20Computer%20Architecture%20(ISCA%20'17)
 Search print copy at ETH Library

Files in this item

FilesSizeFormatOpen in viewer

There are no files associated with this item.

Publication type

Show simple item record