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dc.contributor.author
Sun, Junliang
dc.contributor.author
Zhang, Daliang
dc.contributor.author
He, Zhanbing
dc.contributor.author
Hovmöller, Sven
dc.contributor.author
Zou, Xiaodong
dc.contributor.author
Gramm, Fabian
dc.contributor.author
Baerlocher, Christian
dc.contributor.author
McCusker, Lynne B.
dc.contributor.editor
Luysberg, Martina
dc.contributor.editor
Tillmann, Karsten
dc.contributor.editor
Weirich, Thomas
dc.date.accessioned
2023-10-23T13:44:07Z
dc.date.available
2017-06-08T20:32:23Z
dc.date.available
2023-10-23T13:44:07Z
dc.date.issued
2008
dc.identifier.isbn
978-3-540-85154-7
en_US
dc.identifier.isbn
978-3-540-85156-1
en_US
dc.identifier.other
10.1007/978-3-540-85156-1_379
en_US
dc.identifier.uri
http://hdl.handle.net/20.500.11850/12221
dc.description.abstract
Many zeolite structures have remained unsolved for a long time because of their structural complexity, the size of the crystallites or the presence of defects or impurities. By combining electron microscopy and X-ray powder diffraction data, some of them have been solved (e.g. the high-silica zeolite IM-5, which was first reported in 1998 [1] and recently solved using a charge-flipping structure solution algorithm [2]), while for other zeolites, good X-ray powder diffraction data are hard to obtain (e.g. polymorph A or B of zeolite Beta). Here we demonstrate a complete structure determination of IM-5 (one of the most complicated zeolited) and polymorph B of zeolite Beta [3] using electron crystallography alone. This shows the power and advantage of structure determination by electron microscopy compared with the X-ray diffraction techniques. The method is general and can be applied to both zeolites and other materials, where the crystals are too small or the structure too complicated to be solved from X-ray powder diffraction data alone [4]. It is particularly useful for structures containing defects.
en_US
dc.language.iso
en
en_US
dc.publisher
Springer
en_US
dc.subject
IM-5
en_US
dc.subject
zeolite Beta
en_US
dc.subject
SAED
en_US
dc.subject
HRTEM
en_US
dc.subject
Electron crystallography
en_US
dc.title
Structure determination of zeolites by electron crystallography
en_US
dc.type
Conference Paper
ethz.book.title
EMC 2008: 14th European Microscopy Congress, Volume 1: Instrumentation and Methods
en_US
ethz.pages.start
757
en_US
ethz.pages.end
758
en_US
ethz.event
14th European Microscopy Congress (EMC 2008)
en_US
ethz.event.location
Aachen, Germany
en_US
ethz.event.date
September 1-5, 2008
en_US
ethz.publication.place
Berlin
en_US
ethz.publication.status
published
en_US
ethz.leitzahl
03401 - Steurer, Walter
en_US
ethz.leitzahl.certified
03401 - Steurer, Walter
ethz.date.deposited
2017-06-08T20:32:31Z
ethz.source
ECIT
ethz.identifier.importid
imp59364c13583d721112
ethz.ecitpid
pub:23518
ethz.eth
yes
en_US
ethz.availability
Metadata only
en_US
ethz.rosetta.installDate
2017-07-13T08:26:20Z
ethz.rosetta.lastUpdated
2024-02-03T05:38:03Z
ethz.rosetta.versionExported
true
ethz.COinS
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