TanDEM-X: A single-pass SAR interferometer for global DEM generation and demonstration of new SAR techniques
Publication status
publishedExternal links
Book title
2015 IEEE International Geoscience and Remote Sensing Symposium (IGARSS)Pages / Article No.
Publisher
IEEEEvent
Subject
TanDEM-X; Bistatic SAR formation; SAR interferometry; Global Digital Elevation Model (DEM)Organisational unit
03849 - Hajnsek, Irena / Hajnsek, Irena
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yes
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