Improving Resilience to Timing Errors by Exposing Variability Effects to Software in Tightly-Coupled Processor Clusters
dc.contributor.author
Rahimi, Abbas
dc.contributor.author
Cesarini, Daniele
dc.contributor.author
Marongiu, Andrea
dc.contributor.author
Gupta, Rajesh K.
dc.contributor.author
Benini, Luca
dc.date.accessioned
2017-06-11T10:56:00Z
dc.date.available
2017-06-11T10:56:00Z
dc.date.issued
2014-04
dc.identifier.issn
2156-3357
dc.identifier.other
10.1109/JETCAS.2014.2315883
dc.identifier.uri
http://hdl.handle.net/20.500.11850/86685
dc.language.iso
en
dc.publisher
IEEE
dc.subject
Cross-layer variability management
dc.subject
OpenMP
dc.subject
Processor clusters
dc.subject
Recovery
dc.subject
Robust system design
dc.subject
Scheduling
dc.subject
Timing errors
dc.subject
Variations
dc.title
Improving Resilience to Timing Errors by Exposing Variability Effects to Software in Tightly-Coupled Processor Clusters
dc.type
Journal Article
ethz.journal.title
IEEE Journal on Emerging and Selected Topics in Circuits and Systems
ethz.journal.volume
4
ethz.journal.issue
2
ethz.journal.abbreviated
IEEE j. emerg. sel. top. circuits syst.
ethz.pages.start
216
ethz.pages.end
229
ethz.notes
Manuscript received 1 February 2014, Revised 21 February 2014, Accepted 26 March 2014.
ethz.identifier.wos
ethz.identifier.nebis
006163471
ethz.publication.place
Piscataway, NJ
ethz.publication.status
published
ethz.leitzahl
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02140 - Dep. Inf.technologie und Elektrotechnik / Dep. of Inform.Technol. Electrical Eng.::02636 - Institut für Integrierte Systeme / Integrated Systems Laboratory::03996 - Benini, Luca / Benini, Luca
ethz.leitzahl.certified
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02140 - Dep. Inf.technologie und Elektrotechnik / Dep. of Inform.Technol. Electrical Eng.::02636 - Institut für Integrierte Systeme / Integrated Systems Laboratory::03996 - Benini, Luca / Benini, Luca
ethz.date.deposited
2017-06-11T10:59:48Z
ethz.source
ECIT
ethz.identifier.importid
imp5936521900eee12915
ethz.ecitpid
pub:136463
ethz.eth
yes
ethz.availability
Metadata only
ethz.rosetta.installDate
2017-07-12T15:59:44Z
ethz.rosetta.lastUpdated
2024-02-01T21:59:54Z
ethz.rosetta.versionExported
true
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Journal Article [130177]