Derivation of Shockley-Read-Hall recombination rates in bulk and PD-SOI MOSFET's channels valid in all modes of operation
dc.contributor.author
Sallese, Jean-Michel
dc.contributor.author
Krummenacher, François
dc.contributor.author
Fazan, Pierre
dc.date.accessioned
2017-06-10T01:23:42Z
dc.date.available
2017-06-10T01:23:42Z
dc.date.issued
2004-09
dc.identifier.issn
0038-1101
dc.identifier.other
10.1016/j.sse.2004.02.017
dc.identifier.uri
http://hdl.handle.net/20.500.11850/49980
dc.language.iso
en
dc.publisher
Elsevier
dc.subject
Generation
dc.subject
Recombination
dc.subject
SRH
dc.subject
MOSFET
dc.subject
EKV
dc.subject
SOI
dc.title
Derivation of Shockley-Read-Hall recombination rates in bulk and PD-SOI MOSFET's channels valid in all modes of operation
dc.type
Journal Article
ethz.journal.title
Solid-State Electronics
ethz.journal.volume
48
ethz.journal.issue
9
ethz.journal.abbreviated
Solid-State Electron.
ethz.pages.start
1539
ethz.pages.end
1548
ethz.notes
Received 1 March 2003, Revised 1 December 2003, Accepted 1 February 2004, Available online 20 April 2004.
ethz.identifier.wos
ethz.identifier.nebis
000055320
ethz.publication.place
Kidlington
ethz.publication.status
published
ethz.date.deposited
2017-06-10T01:26:13Z
ethz.source
ECIT
ethz.identifier.importid
imp59364f492e2f137706
ethz.ecitpid
pub:81965
ethz.eth
yes
ethz.availability
Metadata only
ethz.rosetta.installDate
2017-07-13T12:18:02Z
ethz.rosetta.lastUpdated
2024-02-01T18:46:23Z
ethz.rosetta.versionExported
true
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Journal Article [130591]