Dopants and Traps in Nanocrystal-Based Semiconductor Thin Films: Origins and Measurement of Electronic Midgap States
Open access
Datum
2020-02-25Typ
- Journal Article
Persistenter Link
https://doi.org/10.3929/ethz-b-000397313Publikationsstatus
publishedExterne Links
Zeitschrift / Serie
ACS Applied Electronic MaterialsBand
Seiten / Artikelnummer
Verlag
American Chemical SocietyThema
Nanocrystal thin films; PbS; trap state; electronic midgap state; Fourier transform photocurrent spectroscopy; FTPS; energy-resolved electrochemical impedance spectroscopy; ER-EISOrganisationseinheit
03895 - Wood, Vanessa / Wood, Vanessa
09701 - Yarema, Maksym / Yarema, Maksym