Studies of the Yield of Back-Scattered Electrons in Scanning Field Emission Microscopy
Open access
Date
2019Type
- Other Conference Item
ETH Bibliography
yes
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Permanent link
https://doi.org/10.3929/ethz-b-000393843Publication status
publishedExternal links
Publisher
ETH Zurich, Laboratory for Solid State PhysicsEvent
Organisational unit
03351 - Pescia, Danilo (emeritus) / Pescia, Danilo (emeritus)
Funding
606988 - Sources, Interaction with Matter, Detection and Analysis of Low Energy Electrons 2 (EC)
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ETH Bibliography
yes
Altmetrics