Electron Microprobe Analysis of Minor and Trace Elements in Beam Sensitive Materials: How Far Can We Go?

Metadata only

Autor(in)

Datum

2019-08

Typ

Conference Paper

ETH Bibliographie

yes

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Publikationsstatus

published

Externe Links

Zeitschrift / Serie

Microscopy and Microanalysis

Band

25(S2)

Seiten / Artikelnummer

2312 - 2313

Verlag

Cambridge University Press

Konferenz

Microscopy & Microanalysis (MM 2019), Portland, OR, USA, August 4-8, 2019

Organisationseinheit

03958 - Bachmann, Olivier / Bachmann, Olivier
03958 - Bachmann, Olivier / Bachmann, Olivier

Anmerkungen

Conference lecture held on August 7, 2019

Mehr

ETH Bibliographie

yes

Altmetrics

Research Collection