Iterative De-Embedding and Extracted Maximum Oscillation Frequency f-MAX in mm-Wave InP DHBTs: Impact of Device Dimensions on Extraction Errors - Research Collection

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Autor(in)

Arabhavi, Akshay M.

Flueckiger, Ralf

Ostinelli, Olivier

Bolognesi, Colombo R.

Datum

2018-11-29

Typ

Conference Paper

Zitate

4 Zitate in Scopus

ETH Bibliographie

yes

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Publikationsstatus

published

Externe Links

https://doi.org/10.1109/BCICTS.2018.8550904

Buchtitel

2018 IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium (BCICTS)

Seiten / Artikelnummer

110 - 113

Verlag

IEEE

Konferenz

2018 IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium (BCICTS), San Diego, CA, USA, October 15-17, 2018

Thema

InP/GaAsSb DHBTs; sub-millimeter wave measurements; iterative de-embedding; Size dependence; frequency range

Organisationseinheit

03721 - Bolognesi, Colombo / Bolognesi, Colombo
02205 - FIRST-Lab / FIRST Center for Micro- and Nanoscience

Mehr

Alle Metadaten anzeigen

Zitate

4 Zitate in Scopus

ETH Bibliographie

yes

Altmetrics