Detecting and mitigating data-dependent DRAM failures by exploiting current memory content
dc.contributor.author
Khan, Samira
dc.contributor.author
Wilkerson, Chris
dc.contributor.author
Wang, Zhe
dc.contributor.author
Alameldeen, Alaa R.
dc.contributor.author
Lee, Donghyuk
dc.contributor.author
Mutlu, Onur
dc.date.accessioned
2018-01-26T12:51:10Z
dc.date.available
2017-12-05T05:35:54Z
dc.date.available
2018-01-26T12:51:10Z
dc.date.available
2017-12-20T14:53:39Z
dc.date.available
2018-01-26T12:43:18Z
dc.date.issued
2017
dc.identifier.isbn
978-1-4503-4952-9
en_US
dc.identifier.other
10.1145/3123939.3123945
en_US
dc.identifier.uri
http://hdl.handle.net/20.500.11850/237618
dc.language.iso
en
en_US
dc.publisher
Association for Computing Machinery
dc.subject
DRAM
en_US
dc.subject
Data-Dependent Failures
en_US
dc.subject
System-Level Failure De- tection and Mitigation
en_US
dc.subject
Performance
en_US
dc.subject
Energy
en_US
dc.subject
Fault Tolerance
en_US
dc.subject
Refresh
en_US
dc.subject
Retention Failures
en_US
dc.subject
Memory Systems
en_US
dc.subject
Reliability
en_US
dc.title
Detecting and mitigating data-dependent DRAM failures by exploiting current memory content
en_US
dc.type
Conference Paper
ethz.book.title
Proceedings of the 50th Annual IEEE/ACM International Symposium on Microarchitecture (MICRO-50 '17)
en_US
ethz.pages.start
27
en_US
ethz.pages.end
40
en_US
ethz.event
50th Annual IEEE/ACM International Symposium on Microarchitecture (MICRO-50 '17)
en_US
ethz.event.location
Cambridge, MA, USA
ethz.event.date
October 14-18, 2017
en_US
ethz.identifier.scopus
ethz.publication.place
New York, NY
ethz.publication.status
published
en_US
ethz.leitzahl
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02140 - Dep. Inf.technologie und Elektrotechnik / Dep. of Inform.Technol. Electrical Eng.::09483 - Mutlu, Onur / Mutlu, Onur
en_US
ethz.leitzahl.certified
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02140 - Dep. Inf.technologie und Elektrotechnik / Dep. of Inform.Technol. Electrical Eng.::09483 - Mutlu, Onur / Mutlu, Onur
en_US
ethz.date.deposited
2017-12-05T05:36:01Z
ethz.source
SCOPUS
ethz.source
FORM
ethz.eth
yes
en_US
ethz.availability
Metadata only
en_US
ethz.rosetta.installDate
2018-01-31T11:24:41Z
ethz.rosetta.lastUpdated
2024-02-02T03:50:53Z
ethz.rosetta.versionExported
true
dc.identifier.olduri
http://hdl.handle.net/20.500.11850/217022
dc.identifier.olduri
http://hdl.handle.net/20.500.11850/223647
ethz.COinS
ctx_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.atitle=Detecting%20and%20mitigating%20data-dependent%20DRAM%20failures%20by%20exploiting%20current%20memory%20content&rft.date=2017&rft.spage=27&rft.epage=40&rft.au=Khan,%20Samira&Wilkerson,%20Chris&Wang,%20Zhe&Alameldeen,%20Alaa%20R.&Lee,%20Donghyuk&rft.isbn=978-1-4503-4952-9&rft.genre=proceeding&rft_id=info:doi/10.1145/3123939.3123945&rft.btitle=Proceedings%20of%20the%2050th%20Annual%20IEEE/ACM%20International%20Symposium%20on%20Microarchitecture%20(MICRO-50%20'17)
Dateien zu diesem Eintrag
| Dateien | Größe | Format | Im Viewer öffnen |
|---|---|---|---|
|
Zu diesem Eintrag gibt es keine Dateien. |
|||
Publikationstyp
-
Conference Paper [35553]