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dc.contributor.author
Hao, Cong
dc.contributor.author
Dotzel, Jordan
dc.contributor.author
Xiong, Jinjun
dc.contributor.author
Benini, Luca
dc.contributor.author
Zhang, Zhiru
dc.contributor.author
Chen, Deming
dc.date.accessioned
2021-09-22T09:04:45Z
dc.date.available
2021-08-13T03:59:42Z
dc.date.available
2021-09-22T09:04:45Z
dc.date.issued
2021-08
dc.identifier.issn
2168-2364
dc.identifier.issn
2168-2356
dc.identifier.other
10.1109/MDAT.2021.3069952
en_US
dc.identifier.uri
http://hdl.handle.net/20.500.11850/500780
dc.language.iso
en
en_US
dc.publisher
IEEE
en_US
dc.subject
Edge AI
en_US
dc.subject
Edge device
en_US
dc.subject
Machine learning
en_US
dc.subject
IoT
en_US
dc.subject
Design methodology
en_US
dc.subject
Co-design
en_US
dc.title
Enabling Design Methodologies and Future Trends for Edge AI: Specialization and Codesign
en_US
dc.type
Journal Article
dc.date.published
2021-03-31
ethz.journal.title
IEEE Design & Test
ethz.journal.volume
38
en_US
ethz.journal.issue
4
en_US
ethz.pages.start
7
en_US
ethz.pages.end
26
en_US
ethz.identifier.wos
ethz.identifier.scopus
ethz.publication.place
New York, NY
en_US
ethz.publication.status
published
en_US
ethz.leitzahl
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02140 - Dep. Inf.technologie und Elektrotechnik / Dep. of Inform.Technol. Electrical Eng.::02636 - Institut für Integrierte Systeme / Integrated Systems Laboratory::03996 - Benini, Luca / Benini, Luca
ethz.leitzahl.certified
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02140 - Dep. Inf.technologie und Elektrotechnik / Dep. of Inform.Technol. Electrical Eng.::02636 - Institut für Integrierte Systeme / Integrated Systems Laboratory::03996 - Benini, Luca / Benini, Luca
ethz.date.deposited
2021-08-13T04:00:03Z
ethz.source
WOS
ethz.eth
yes
en_US
ethz.availability
Metadata only
en_US
ethz.rosetta.installDate
2021-09-22T09:04:59Z
ethz.rosetta.lastUpdated
2022-03-29T13:28:51Z
ethz.rosetta.versionExported
true
ethz.COinS
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